The SPECTRO MIDEX X-ray fluorescence spectrometer was developed for the elemental analysis tasks in industry, research and the sciences that require a non-destructive measuring technique that is extremely sensitive and offers a small measuring spot.
SPECTRO MIDEX was developed for all these requirements, right down to the finest details. With input from customers, this X-ray fluorescence spectrometer has been extended and optimized. The result is an ED-XRF spectrometer that sets new standards for analytic performance and ease of use.
X-Strata 980, is our rapid, non-destructive coating thickness measurement and elemental analysis machine, that also guarantee's you 90 seconds of accuracy for your assay results. This is an XRF known for its high-resolution, large sampling chamber and its quick precision result.